Chinese Journal of Engineering Mathematics ›› 2024, Vol. 41 ›› Issue (6): 1144-1154.doi: 10.3969/j.issn.1005-3085.2024.06.011
Previous Articles Next Articles
YE Rendao, YANG Jianan
Received:
Accepted:
Online:
Published:
Supported by:
Abstract:
Key words: skew-normal one-way classification random effect model, exposure level, EM algorithm, Bootstrap confidence interval
CLC Number:
C812
YE Rendao, YANG Jianan. Bootstrap Inference of Exposure Level with Skew-normal One-way Classification Random Effect Model[J]. Chinese Journal of Engineering Mathematics, 2024, 41(6): 1144-1154.
0 / / Recommend
Add to citation manager EndNote|Reference Manager|ProCite|BibTeX|RefWorks
URL: http://jgsx-csiam.org.cn/EN/10.3969/j.issn.1005-3085.2024.06.011
http://jgsx-csiam.org.cn/EN/Y2024/V41/I6/1144